Feature Points in Qvio
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Hi, I am trying to work on a research application using voxl qvio module.
-> I was hoping to know how the feature points are generated: like the descriptor used for extraction of feature points. (The reason being feature points during overlay are picked from reflections as well.)
-> I see that the Qvio page has not been open-sourced yet. Would it be possible to have a look at the architecture of qvio module ?
(I am referring to this link: https://docs.modalai.com/Qualcomm-Flight-RB5-sdk-qvio-server/ ) -
That is proprietary information embedded in the Qualcomm VIO library, sorry. We hope to have a more open implementation in the future
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Hi, would there be any way to classify the feature points used for QVIO based on some metric so that voxl could be able to handle points that are from reflected surfaces.
I mean there could be some variable that measures the feature point as a potential point from reflection.
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